Abstract: How to test digital logic circuits, and design them to facilitate testability.
Keywords: book review, electronics, testing digital logic, design for testability, integrated circuits, construction.
book cover
Title: Digital Systems Testing and Testable Design
Author: Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
Publisher: IEEE Press
Date Published: September 1994
ISBN: 0780310624
LOCN: TK7874.A23 1990b
Pages: 652
Click below to buy the book
[Book price/availability varies]
Buy from Amazon


This book is being considered for further review, but we do not yet have a copy in hand. under construction icon


Author:        Abramovici, Miron.
Title:         Digital systems testing and testable design /
                  Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
Edition:       Rev. print.
Published:     New York : IEEE Press, [1994], c1990.
Description:   xviii, 652 p. : ill. ; 27 cm.
LC Call No.:   TK7874.A23 1990b
ISBN:          0780310624
Notes:         Includes bibliographical references and index.
Subjects:      Digital integrated circuits -- Testing.
               Digital integrated circuits -- Design and
Other authors: Breuer, Melvin A.
               Friedman, Arthur D.
Control No.:   94233953 


I have taken this program and I highly recommend it to all health-care providers - Orville R. Weyrich, Jr PhD NMD.
Functional Diagnostic Medicine banner ad
For more information, see: The CSI Report and Video and Become a New Patient Magnet

Copyright © 1998     Orville R. Weyrich, Jr.