Author: Abramovici, Miron. Title: Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. Edition: Rev. print. Published: New York : IEEE Press, [1994], c1990. Description: xviii, 652 p. : ill. ; 27 cm. LC Call No.: TK7874.A23 1990b ISBN: 0780310624 Notes: Includes bibliographical references and index. Subjects: Digital integrated circuits -- Testing. Digital integrated circuits -- Design and construction. Other authors: Breuer, Melvin A. Friedman, Arthur D. Control No.: 94233953
I have taken this program and I highly recommend it to all health-care providers - Orville R. Weyrich, Jr PhD NMD. For more information, see: The CSI Report and Video and Become a New Patient Magnet |